Value analysis tear down a new process for product development and innovation 1st ed Edition Kaufman

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Value analysis tear down a new process for product development and innovation 1st ed Edition Kaufman Digital Instant Download

Author(s): Kaufman, J. Jerry; Sato, Yoshihiko
ISBN(s): 9781615835799, 1615835792
Edition: 1st ed
File Details: PDF, 8.81 MB
Year: 2005
Language: english
SKU: EB-5428670 Category: Tags: , , ,