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Nonlinear Transistor Model Parameter Extraction Techniques 1st Edition by Matthias Rudolph, Christian Fager, David E Root ISBN 0521762103 9780521762106

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Nonlinear Transistor Model Parameter Extraction Techniques 1st Edition Matthias Rudolph Digital Instant Download

Author(s): Matthias Rudolph, Christian Fager, David E. Root
ISBN(s): 9780521762106, 0521762103
Edition: 1
File Details: PDF, 13.53 MB
Year: 2011
Language: english
SKU: EB-2328910 Category: Tags: , ,

Nonlinear Transistor Model Parameter Extraction Techniques 1st Edition by Matthias Rudolph, Christian Fager, David E Root – Ebook PDF Instant Download/Delivery: 0521762103, 9780521762106
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Product details:

ISBN 10: 0521762103 
ISBN 13: 9780521762106
Author: Matthias Rudolph, Christian Fager, David E Root

Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction.

Nonlinear Transistor Model Parameter Extraction Techniques 1st Table of contents:

  • Introduction to Nonlinear Transistor Modeling

    • Overview of Transistor Behavior

    • Importance of Accurate Parameter Extraction

    • Applications and Challenges

  • Fundamentals of Transistor Physics

    • Semiconductor Physics Basics

    • Transistor Types and Characteristics

    • Nonlinear Effects in Transistors

  • Mathematical Modeling of Transistors

    • Model Formulations

    • Compact Models vs. Physical Models

    • Nonlinear Parameter Definitions

  • Parameter Extraction Techniques

    • Measurement Methods

    • Curve Fitting Approaches

    • Optimization Algorithms

    • Statistical and Heuristic Methods

  • Data Acquisition and Preprocessing

    • Experimental Setup

    • Data Noise and Filtering

    • Calibration Procedures

  • Advanced Extraction Methods

    • Machine Learning Approaches

    • Genetic Algorithms and Evolutionary Methods

    • Neural Networks and Regression Techniques

  • Model Validation and Verification

    • Goodness of Fit Metrics

    • Sensitivity Analysis

    • Case Studies

  • Applications and Case Studies

    • Circuit Simulation Examples

    • Power Electronics

    • RF and High-Frequency Devices

  • Future Trends in Parameter Extraction

    • Emerging Technologies

    • Integration with CAD Tools

    • Challenges and Opportunities

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Tags: Matthias Rudolph, Christian Fager, David E Root, Nonlinear Transistor