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Testing for Small Delay Defects in Nanoscale CMOS Integrated Circuits 1st Edition Sandeep K. Goel

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Testing for Small Delay Defects in Nanoscale CMOS Integrated Circuits 1st Edition Sandeep K. Goel Digital Instant Download

Author(s): Sandeep K. Goel, Krishnendu Chakrabarty
ISBN(s): 9781439829424, 143982942X
Edition: 1
File Details: PDF, 20.23 MB
Year: 2013
Language: english
SKU: EB-4748426 Category: Tags: ,

Testing for Small Delay Defects in Nanoscale CMOS Integrated Circuits 1st Edition Sandeep K. Goel – Ebook Instant Download/Delivery ISBN(s): 9781439829424,143982942X